Dr. Ed Morse of UNC Charlotte to Deliver Keynote at the 2016 Coordinate Metrology Society Conference (CMSC)
Keynote Address is entitled “Forging the Future of Large Scale Manufacturing”
The Coordinate Metrology Society (CMS) today announced Dr. Ed Morse, professor at UNC Charlotte, will present the keynote address at the 32th Annual Coordinate Metrology Society Conference (CMSC), July 25 – 29, at the Embassy Suites by Hilton in Murfreesboro, TN. Since 1999, Dr. Morse has been a professor of mechanical engineering at UNC Charlotte, pursuing research in both tolerancing and metrology.
During this time, Morse has further extended his experience to large-scale metrology systems, including laser trackers, photogrammetry and laser radar systems. He also spent a year at NIST (National Institute of Standards and Technology) working in the large scale metrology group from 2007 – 2008. Prof. Morse’s areas of specialty are dimensional metrology, coordinate measurement machines, GD&T (geometric dimensioning and tolerancing), and statistical control. He currently serves as a team leader for the PrecisionPath Consortium for Large Scale Manufacturing, along with Ron Hicks, CMS PrecisionPath Chair.
Dr. Ed Morse will kick off the 2016 CMSC on Tuesday morning, July 26, with his address covering the work of the PrecisionPath Consortium for Large-scale Manufacturing and its roadmap for the future of metrology and manufacturing. After receiving his BS from Swarthmore College in Pennsylvania, he began his engineering career at Brown and Sharpe Manufacturing Company. He first worked as an application engineer for CMM software, then transitioned into the Advanced Systems group. In 1993, he returned to graduate school at Cornell University, where he earned both his MS and PhD degrees in Mechanical Engineering. Morse is certified by the ASME (The American Society of Mechanical Engineers) as a Senior Level GD&T professional.
The Coordinate Metrology Society Conference attracts 3D industrial measurement professionals and scientists with its enviable slate of expert-level technical presentations in the field of metrology. Attendees gather each year to share information and discuss measurement strategies utilized by industries such as aerospace, automotive, shipbuilding, power generation, and more. The CMSC’s packed Exhibition Hall, Measurement and Educational Zones are prime resources for novices and veterans to learn more about industry best practices, portable 3D coordinate measurement solutions, scientific research and developments, and technology management
CMSC Call for Papers Continues through March 25, 2016
The CMSC Call for Papers continues until March 25, 2016. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at 2016 CMSC. Notification of acceptance will occur on April 8, 2016. For guidelines or more information about presenting a technical paper at CMSC 2016, contact Scott Sandwith, Technical Presentations Coordinator at presentations@cmsc.org. Guidelines for presentations and technical papers can be downloaded at 2016 CMSC Guidelines. Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the prestigious Journal of the CMSC.
About the Coordinate Metrology Society
The Coordinate Metrology Society is a membership of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMSand how to join the organization, visit their web site at http://www.CMSC.org.
About the Coordinate Metrology Society Conference
The Coordinate Metrology Society Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe. CMSC has achieved world renown for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.
