Nikon Corporation (Nikon) has announced a comprehensive suite of enhancements to its XT V Series X-ray and CT systems, strengthening the platform’s position as a world-class solution for non-destructive inspection of electronic components. These enhancements enable operators to achieve better image quality, scan heavier samples, and protect sensitive components from electrostatic discharge and radiation damage.
A software enhancement and five hardware enhancements are available as optional upgrades to the XT V Series, allowing customers to customize their systems based on their specific application requirements.
Software Enhancement:
- High Contrast Filter 2.0: Offers consistently clear imaging that ensures defects are visible immediately, for any combination of sample shape and density.
Hardware Enhancements:
- Heavy Duty Tray: Enables larger, heavier parts to be scanned. Operators can scan more parts in each batch and expand inspection capabilities.
- Diamond Window: Delivers improved image contrast across the operating range, particularly beneficial for low-density and mixed-material samples, resulting in less noise and faster scans.
- Low-Dose Collimator: Protects radiation-sensitive electronics, minimizing dose to sensitive parts such as semiconductor devices while enabling safe inspection of larger batches.
- ESD Safety Upgrade: Provides ESD-safe inspection of sensitive electronic components to IEC 6100-4-2, ANSI/ESD S20.20, and JEDEC JESD625 standards when installed in an ESD-Protected Area (EPA), allowing for confident integration into ESD-safe processes.
- High Magnification CT Arm: Enables higher magnification CT scans for small samples, allowing operators to see finer details than previously possible.
The XT V Series continues to excel in electronics inspection applications, including PCBs, BGAs, chips, and semiconductor devices. The systems maintain their market-leading Xi microfocus X-ray sources and powerful image enhancement capabilities, while the new enhancements provide additional value for customers across electronics manufacturing, semiconductor production, and quality control environments.









































